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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 3676 - 3690 of 4500 items found.

  • Field Management

    Evans Analytical Group®

    EAG offers field-to-final report project management for studies to demonstrate human and environmental safety. As on-site study directors, our Field Managers bring decades of study design, protocol development, analytical oversight, and GLP/QA compliance expertise across a variety of field management study types. In addition, EAG’s access to a broad network of field sites across the United States and Canada ensures that we can deliver the test system, soil characteristics and geography necessary for just about any regulatory need.

  • NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    781397-01 - NI

    ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.

  • NI-9222 , ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    783283-01 - NI

    ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.

  • sbRIO-9223, Non-Enclosed, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    785480-01 - NI

    Non-Enclosed, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO-9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The sbRIO-92233 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the sbRIO-9223: a 10‑position screw terminal or a 25‑pin D‑SUB connector.

  • sbRIO-9269, Non-Enclosed, 100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module

    781120-01 - NI

    Non-Enclosed, 100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The sbRIO‑9269 is a channel‑to‑channel isolated analog output module. The sbRIO‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes. Non-enclosed modules are designed for OEM applications.

  • Advanced Power Supplies

    N7900 Series - Keysight Technologies

    The Keysight Advanced Power System (APS) N7900 Series is a full-featured supply designed for automated test equipment (ATE) applications that benefit from high-speed dynamic sourcing and measurement. The highly integrated N7900 enables you to accelerate your test-system throughput with industry-leading speed and precision measurements. The APS N7900 has all the capabilities of the N6900 but also includes dynamic output power, dynamic measurements, and higher accuracy. While standard on the N7900, high accuracy, dynamic sourcing, and power are available as separate options on the N6900.

  • H.V. Multifuntion Phasing Sticks

    PC7k, PC11k, PC22k, PC33k, PC44k - Standard Electric Works Co., Ltd

    ● No user’s assembled parts.● Dual color-coded scale (%, Vac).● Neon indicator when >1200Vac.● Lightweight, robust & compact.● Carry case included.● Compare between phases.● Measure and test phase to earth.● High quality fiberglass wound rod.● Self powered operation. No battery required.● DC version available.● Measure phase to phase.● Hi immunity to interference fields.● Suitable for indoor and outdoor use.● Current is limited to ±1 milli-ampere.● Grounded or ungrounded systems.● Meets IEC 61481 (excludes PC44K).

  • NI-9223, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    783284-01 - NI

    ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9223 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9223: either four, 2‑position screw terminal connectors or four BNC connectors.

  • NI-9223, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module

    781398-01 - NI

    ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9223 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9223: either four, 2‑position screw terminal connectors or four BNC connectors.

  • Adjustable Press Plate Bed of Nails Testers

    Protector Adjustable Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Edge Press Technology Bed of Nails Testers

    Protector Edge Press Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Press Down Rods Bed of Nails Testers

    Protector Press Rods Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Bench Electronic Loads

    EL30000 Series - Keysight Technologies

    The Keysight EL30000 Series Bench electronic load with a built-in data logger provides new levels of test insights for your devices like power supplies, batteries, DC to DC converters, and more. View voltage and current trends to make real-time decisions, rather than waiting hours for a test to complete. At the heart of the EL30000 is a highly accurate measurement system that provides real-time updates to the large display. Keysight’s PathWave BenchVue software allows you to operate the electronic load remotely, execute test sequences, log data, and integrate with other test instruments. Single and dual-channel models are available with up to 600 W for measurements that require more power. Start your test with confidence and finish with results you trust.

  • 6-24V LED Heavy Duty Circuit Tester

    1646 - Peaceful Thriving Enterprise Co Ltd

    Check on 6, 12 and 24V systems. Quickly and safely test high and low voltages on all vehicle voltages, including computerized engine. High impedance to protect sensitive electronic sensors, microprocessors, electronic ignition components and air bags.

  • 6-24V LED Heavy Duty Circuit Tester

    1647 - Peaceful Thriving Enterprise Co Ltd

    Check on 6, 12 and 24V systems. Quickly and safely tests high and low voltages on all vehicle voltages, including computerized engine. High impedance protects sensitive electronic sensors, microprocessors, electronic ignition components and air bags.

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